X-ray Based Metrology and Elemental Analysis solutions
AFM (Atomic Force Microscope)
X-ray Metrology Solutions
Micro & Nano CT
Optical Metrology Solutions
Tricorn (台湾)
VOC / AMC detector in manufacturing environment with sub-ppb level of capability.
TC TECH Sweden AB (瑞典)
A patented unique system for the production of light guide plates
TCP 1000 HT/HP; 150 HPE; 100 HP
TCP EE, Edge Embossing
ORC (日本)
Stepper : Bump, Cu Post, RDL, TSV
lamp : UV lamp
Taiwan Electron Microscope Instrument Corporation (台湾)
桌上型扫描电子显微镜与液态检测模组
Desktop SEM & Liquid-Phase Inspection Modules
BEI + STEM analysis
Energy dispersive X-ray spectrometer (EDS) for elemental analysis
Software for 3D view and surface roughness measurement functions
ASMPT
ASM Pacific Technology Limited (ASMPT) is a leading integrated solutions provider in Semiconductor and Electronics industries. We have three business segments – Back-end Equipment, Materials, and NEXX Products….
NvisANA (韩国)
晶圆表面不纯物分析设备
Wafer Impurity Contamination Monitoring System
M-SPEC 金属不纯物分析
I-SPEC 离子不纯物分析
O-SPEC 有机不纯物分析
GIM/CIM 化学气体/化学品不纯物分析
Ast Ltd. (台湾)
LED E-Beam Evaporator: Metal, ITO Film Evaporator.
LED Spin Coater/Developer: Photo Resist Spin Coater/Developer
LED Plasma Etcher/Stripper: Sapphire, Mesa ICP Etcher.
LED Wafer Bonder
CAPRES A/S (丹麦)
Micro- and Nano Scale Electrical Metrology
Ultra thin films sheet resistance and HALL mobility in-line monitoring: microRSP, microHALL
MRAM and magnetic R/W head, tunneling resistance and magneto-resistance measurement: CIPTech